PowerXplorer PX5-400

  • Product No:PowerXplore-400
  • Manufacturer:Dranetz -BMI

The Power Xplorer PX5-400 integrates the most advanced feature set available in a power monitoring instrument, with an easy-to-navigate, color graphical user interface. With high-speed sampling and data capture (1 microsecond/channel), this 8-channel workhorse simultaneously captures and characterizes thousands of parameters, using a range of standard and customizable operating modes. The unique measurement capabilities of the Power Xplorer include capture of low-medium-high frequency transients through peak, waveshape, rms duration and adaptive high-speed sampling, as well as power measurements to clearly characterize voltage harmonics, non-sinusoidal and unbalanced systems.

• High Definition PQ & Energy Monitoring – 1000Vrms, AC/DC, 512 samples/cycle
• High Speed Digitized Transients to 1us – 10 to 2000Vpk
• 50/60Hz and 400Hz operating modes
• Eight channels, 4 voltage & 4 current
• AnswerModules – Sag directivity, PF capacitor identification, motor – automatic event categorization
• Advanced PQ – IEC 61000-4-30 Class A & IEEE 1159 compliant
• Harmonics – IEC 61000-4-7, IEEE 519 (2014)
• Transient capabilities – V & I – waveshape triggers, high speed. Well beyond standards requirements
• IEEE 1459 Advanced Power Measurements

  • Measured Parameters
    (4) differential inputs, 1-600 Vrms, AC/DC, 0.1% rdg + 0.05% FS, 256 samples/cycle, 16 bit ADC
    (4) inputs with CTs 0.1-6000 Arms CT-dependent, AC/DC, 0.1%rdg + CTs, 256 samples/cycle, 16 bit ADC
    1 MHz High Speed Sampling, 14 bit ADC, 1%FS
    Frequency Range, 10m Hz resolution, 15-20 Hz, 45-65 Hz, or 350-450 Hz
    Phase Lock Loop – Generator tracking
    Phase Lock Loop – Standard PQ mode

  • Standards Compliance (50/60Hz systems only)

  • Power Quality IEC 61000-4-30 Class A: Edition 2 (2008)
    IEEE 1159: 2009

  • Power
    IEEE 1459: 2000

  • Harmonics
    IEC 61000-4-7 Class 1: Edition 2 (2008)
    IEEE 519: 2014

  • Voltage Flicker
    IEC 61000-4-15: Edition 2 (2010)
    IEEE 1453: 2011

  • Compliance/Testing
    EN 50160: 2010