Static testing system designed for IGBT, MOSFET and Diode from single chip to complex power modules
Complete Dynamic and Static test available as standalone programs as well as combined
Up to 8000A current and 10KV voltage
200C heating test stage
Designed for IGBT, MOSFET and Diode from single chip to complex power modules
Complete Dynamic and Static test available as standalone programs as well as combined
IGBT: test fully compliant with IEC 60747-9 edition 2.0
Diode: test fully compliant test IEC 60747-2 edition 2
Customizable test options
Fully compliant with international safety standards
Fully compatible with Lemsys test frame as well as with any kind of handler.
Seamless data transfer for quality statistical analysis Up to date Graphical User Interface
Test Item：
IGES ：Ige 0 - 10μA,Vge 0-100V
VGE(th) ：Vge 0 - 20V ,ice 0-2A
VCEsat：Vce 0 - 10V，Ice 0.1-8000A
Rdson:0.1-500ohm
VF:Vf 0 - 10V，If 0.1-8000A
VCES: Ice 0.1uA-100mA ,Vce 0-10000V
ICES: Vce0 - 10000V Ice0.01 - 100mA
Optional：
VP
Module Type：
Single Swithc, Half-bridge,PIM，3-level and etc
