The Model 4003 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989.
This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
Convenient, precise, repeatable operation
Computer controlled for automated testing
The 20A or 30A Options allow user to analyze HBM and/or HMM circuits for operation characteristics and immunity.
Pulse current: 20 amps @ short circuit; 0-10 amps @ 50Ωload, 30A options available
Pulse width: 75ns to 150ns standard; 500 ns option available
Pulse voltage: 0-500 v@ 50Ωload, 1000 v @ open circuit (step increments:≥0.05v)
Pulse risetime: (10-90%): 0.2, 2, 10 ns (built-in, software selectable) optional rise time filter values are available
Leakage voltage: 0 to +/-500v (Model 6487),+/-200v (Model 2400)
Leakage current sensitivity: 10-12 to 2.5 x 10-3 amps (Model 6487)