Four-point probe surface resistance test system consists of 5601TSR surface resistance tester, QT-50 manual test console. The system uses four-point probe principle to measure the surface resistance / resistance coefficient
Measuring materials for wafer or ITO film and other materials
Measurement size can be wafer or square size
Measure the surface resistance value Ω / □ directly without calculation
System is small, light weight, easy to operate, with anti-static function
Optional QT-60 large-size manual test console, QT-70 automatic probe test station or ST-610 handheld probe for measurement
