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SCI FilmTek™ TSV Metrology
Automated Wafer Thickness Measurement System
High Accuracy Spectroscopic Reflectometry Thin Film Measurement System
High Accuracy Spectroscopic Reflectometry and Spectrosopic Ellipsometry Thin Film Measurement System
Thin flim metrology system
SCI-DUV Reflection and Transmission Spectrophotometry
Film Wizard™ Software