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    • Semiconductor
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        • Sheet Resistance/PN/Life Time
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        • Carbon Oxgen Index Measurement
        • Surface Inspection
        • Mask Aligner
        • Semiconductor Device Characterizer
        • Probe Station/Probe Card/SEMI Relative Equipment
      • FPD
        • Thinfilm Resistivity/Thickness
        • Optical Inspection
        • Spinning Nozzle & Consumable Material
        • Liquid Crystal Resistivity Measurement
        • Touchpanel Automatic Tester
      • Solar
        • Sheet Resistance/PN/Life Time
        • Film Thickness/Reflectance
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        • Concentrator Solar Cell
    • Compound Semiconductor
      • Substrate & Epi Layer Tester
        • PL Photoluminescence spectrometer
        • Hall Effect
        • Electrochemistry CV
        • Epi Layer Thickness
        • Non-contact resistivity meter/ultra high resistivity meter
        • Surface Inspection/Geometry
        • Deep transient spectrum test
      • Chip Process & Package
        • LED Photoelectric Test
        • Probe Station/Probe
        • Film Thickness and Resistivity Meter
        • Plasma CVD System
        • Mask Aligner
    • Test & Measurement
      • Optical Metrology
        • Spectral optical spectrometer/Night Vision
        • Illuminometer
        • Reflectance/Transmission Measurement
        • Standard light source/Integrating sphere
        • Image Quality Analysis
      • Calibration & Metrology
        • Multiple Function Calibration
        • High Precision Digital Multimeter
        • Standard Power Source
        • Standard Resistor/Capacitor/ Inductor
        • Electricians Test Equipment & Calibrator
        • High Accuracy LCR Meter/High Accuracy Digital Bridge
        • Optical Metrology
        • Other Calibration Instrument
      • Anti-ESD Solution
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        • ESD Ionizer
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        • High Voltage Power Amplifier/Pulse Generator
        • Ferroelectric/Piezoelectric Material
        • Material Characteristic Analysor
        • Other Scientific research instrument
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