The M200FA Manual Probe Station specifically designed for failure analysis applications, Parametric (DC to Low Level), High Power & ULTRA fast I.V./C.V. probing.
Flexible for a wide range of applications,DC Parametric, Low Current, High Power plus many more.
Precision engineering for reliable and repeatable sub-micron probing.
Adaptable for industry standard testers.
Temperature probing from –65°C to +400°C utilizing Wentworth’s GuardMasterTM
Customizable product enhancing hardware and software options.
Easy to use fine/course X/Y controls and
Fine Adjust Z/Platen Adjustment.
Wide range of product enhancing accessories.
Robust mechanical design.
Cost effective test solutions.
SETTING THE STANDARD
Wentworth's M200FA manual prober enables you to quickly obtain accurate measurements. At the core of M200FA is a highly stable, featureladen platform to capture repeatable, precision measurements. Ultilzing either Wentworth replaceable probes or DC cantilever probe cards the M200FA prober is an ideal platform for a variety of test applications.
HIGH POWER
The M200FA High Power configuration addresses today’s power semiconductor test challenges with Low Contact Resistance Measurements requiring accurate measurements at high voltages. Kelvin Chucks & Backside probing solutions allow Contact Resistance measurements in the milli ohm range.
High Current probes & probe cards (up to 100A) handle and distribute excessive current loads. Dedicated HV & HC probes reduce probe and device destruction at high voltages/currents to prevent device heating and arcing at the tip.
DC parameter
Frequency:dc > 100Mhz
Breakdown Voltage:500V
Leakage:+/-10fA (-65°C > +200°C)
+/-20fA (+200°C > +400°C)
High Power
Voltage:3KV (Triax), 10KV (Coax)
Current:200 Amps (Pulsed)
Leakage:<1pA (3KV)
M200FA SPECIFICATIONS | |||
XY STAGE | PLATEN | ||
X Travel | 210mm (8.25") manual travel | Height Adjustment | Via fine adjustment wheel |
Y Travel | 310mm (12.21") manual travel | Separation lift | 10 mm (0.4”) |
LINEAR MOTION GUIDES | DIMENSIONS (WxDxH) | ||
Coarse ratio 1:1 | 70 microns per degree | Prober (excludes optics) | 840x842x610mm 33x32x34” |
Fine ration 10:1 | 7 microns per degree | SHIELDING | |
CHUCK | Light | > 120 db | |
Chuck Flatness | Flat to within 10 µm (0.0004”) | EMI | > 20 db 0.05-0.5 Ghz, 30 db 0.5-30 Ghz |
Theta | Micrometer drive theta, 15º | Weight | |
Fine Lift Movement | Fine lift 250 microns | Prober | 131 kg |
Fine ratio 10:1 | 7 microns per degree |