High Temperature Probe Card  for Semiconductor Reliablity Test

  • Product No:T40
  • Manufacturer:Celadon System, Inc.

AttoFast settling at 1 second:

  • Leakage <1fA/V from -65℃ to 125℃

  • Leakage <2fA/V from 125℃ to 200℃

  • Leakage <4fA/V from 200℃ to 300℃


Low Leakage at 10 seconds:

  • Leakage <5fA/V from -65℃ to 75℃

  • Leakage <10fA/V from 75℃ to 100℃

  • Leakage <50fA/V from 100℃ to 150℃

  • Leakage <300fA/V from 150℃ to 200℃


  • Standard operating range -60℃ to 300℃, Optional to 400℃ or 600℃

  • Up to 50 probes per Low Leakage card

  • Up to 32 probes per AttoFast card

  • Fits standard 4.5" probe card holders

  • Minimum pitch pattern-dependent

  • Standard X-Y accuracy 10% pad size

  • Standard Z accuracy +/- 5 microns

  • Size: 152mm x 114mm, 21mm ceramic; 0.5kg