The ES620 Series Dynamic IV-Curve Test System is an advanced IV curve characterization system designed to simulate ESD events (TLP/ VF-TLP/ HMM pulse) and monitor a device (semiconductors, discrete, circuit modules, etc) in high power time domain.
25 A and 50 A models available
High quality TLP / VF-TLP / HMM pulses
Advanced automatic failure detection methods including; DC Spot Check (V or I), Static IV, Fuse, Breakdown, Bias Source Fluctuation, and customization available
Manual pulsing: Single
Software controlled pulsing: Burst, Repeating, IV-Curve Characterization
Manual Rise-Time selections from 250 ps to 50 ns
Manual Pulse-Width selections from 5 ns
Features are customizable
TLP Specifications:
Standard Rise Time <=200 ps
Maximum injection current 25 A into short / 12.5 A into 50 Ohm 50 A into short / 25 A into 50 Ohm
Pulse Width options from 100 ns
Pulse voltage control in 0.1 V steps
Optional VF-TLP Specifications:
Rise Time <=100 ps
Manual Pulse Width options from 5 ns
Optional HMM Specification:
Up to 12 kV IEC model current injection for low ohm device
45 A first peak, 24 A at 30 ns, 12 A at 60 ns
First peak rise-time 700 ~ 1000 ps
Operation Conditions:
Temperature: -10 to +50°C
Humidity: 20 to 80% RH
Pressure: 68 to 106 kPa
Dimension and Weight:
Stand-alone with handles or 3U rack-mount chassis (14W x 6H x 13.5D inch)
5 kg (10 lb.)
